Showing 1 - 12 of 12 Results
1.
Electromigration Modeling at Circuit Layout Level by Tan, Cher Ming, He, Feifei ISBN: 9789814451208 List Price: $69.95
2.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections (Spr... by Tan, Cher Ming, Gan, Zhengh... ISBN: 9780857293091 List Price: $129.00
3.
Electromigration in Ulsi Interconnections by Tan, Cher Ming ISBN: 9789814273329 List Price: $118.00
4.
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections by Tan, Cher Ming, Li, Wei, Ga... ISBN: 9781447126416 List Price: $159.00
5.
Future Learning in Primary Schools : A Singapore Perspective by Chai, Ching Sing, Lim, Cher... ISBN: 9789812875785 List Price: $129.00
6.
Microelectronic Yield, Reliability, and Advanced Packaging : 28-30 November 2000, Singapore by Tan, Cher Ming, Society of ... ISBN: 9780819439017 List Price: $80.00
7.
Theory and Practice of Quality and Reliability Engineering in Asia Industry by Tan, Cher Ming, Goh, Thong ... ISBN: 9789811032882 List Price: $199.00
8.
Reliability and Failure Analysis of High Power LED Packaging by Tan, Cher Ming, Singh, Pree... ISBN: 9780128224083 List Price: $200.00
9.
Theory and Practice of Quality and Reliability Engineering in Asia Industry by Tan, Cher Ming, Goh, Thong ... ISBN: 9789811098345 List Price: $279.99
10.
Future Learning in Primary Schools : A Singapore Perspective by Chai, Ching Sing, Lim, Cher... ISBN: 9789811011986 List Price: $129.00
11.
Simulated Annealing by Tan, Cher Ming ISBN: 9789537619077
12.
Graphene and Vlsi Interconnects by Tan, Cher-ming, Narula, Udi... ISBN: 9789814877824